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Technology : In Circuit Testing
Process : ICT
TR518F In Circuit Tester
High-End Semiconductor CMOS Switching design- no life limitation concern
High Capacity rack design, test point up to 3584
Utilizing HP Test Jet Technology
Equipped with IC Clamping Diode test
Leakage current and 3-point measurement is able to detect polarity on capacitor
1 MHz Ac Signal for testing small capacity and inductor
Transistor, FET, SCR and photo-coupler testing mode available


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